Fractal analysis has emerged as a vital tool in understanding the inherent complexity and spatial dynamics of urban patterns and networks. By focusing on the properties of self-similarity and scale ...

As integrated circuit (IC) designs have grown in complexity, scale and speed requirements, design rule checking (DRC) has evolved from a routine step into a critical pillar of successful tapeouts.

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.