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Most testing methods for Field Programmable Gate Array (FPGA) on-chip memory are designed for Block RAM, which cannot detect all possible faults in UltraRAM due to its different structures and ...
Abstract: This article demonstrates a low-cost, low-resource field-programmable gate array (FPGA) time-to-digital converter (TDC) method based on dynamic phase shifting (DPS) and high-speed counters ...